NT-MDT NTEGRA

 

Workshop: Scanning Probe Microscopy

ABSTRACT: Over the last 25 years, NT-MDT has been involved in the development, production and support of research instrumentation, primarily, atomic force microscopes (AFM) and its combinations with ultrahigh-resolution spectroscopy for nanotechnology and its applications. NT-MDT’s pathway has been marked by the creation of a large number of devices, whose functions and capabilities cover the broad range of customer needs in different areas: material science, inorganic chemistry, biology, and others. NT-MDT pioneering efforts led to the impressive combination of scanning probe microscopy with Raman spectroscopy.

During the workshop, NT-MDT team will show the unique capabilities of Atomic Force Microscopes that help to uncover the secrets of the nanoworld, discuss different applications, including high-resolution measurements, electrical measurements, nanomanipulations, and perform live measurements of different samples, including samples of workshop participants.

If you are interested to participate in the workshop please send an e-mail olena.zenkina@ontariotechu.ca  to secure the spot. We will apply the first-asked first-served policy.